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Atomic Force Microscopy Fundamentals and Applications.
В наличии
| Местонахождение: Алматы | Состояние экземпляра: новый |
Бумажная
версия
версия
Автор: Dr. Vanarajsinh Solanki,Dr. Abhay Dasadiya and Dr. Pramita Mishra
ISBN: 9786200247247
Год издания: 2019
Формат книги: 60×90/16 (145×215 мм)
Количество страниц: 60
Издательство: LAP LAMBERT Academic Publishing
Цена: 23208 тг
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Отрасли знаний:Код товара: 501437
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Аннотация: This book focus upon AFM working principle, its different modes (i.e., contact, non-contact and tapping modes), analysis of some AFM result and few applications also. this book also underline the features of AFM as high versatile and useful morphological tool to scan a large variety of surfaces, with a planar resolution ranging from nano –meter sclae down to atomic scale. We hope this book may helpful to researcher and student to understand the basic concept of AFM as well as performing with it for different kind of samples.
Ключевые слова: Atomic Force Microscopy
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